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Semiconductor Test Probes

Semiconductor test probes are mainly used for semiconductor chip design verification, wafer testing and finished product testing. They are the core components connecting the chip and test equipment for signal transmission, and play an important role in the quality control of semiconductor products. Test probes are equivalent to a medium. During testing, the head of the probe can be used to contact the object under test, and the other end is used to conduct signals and transfer current. There are many different head types of probes that can be used for different test points, such as pointed, rounded, clawed and so on.

Applications in the semiconductor field

01 wafer test

Chip Probing, referred to as CP, refers to the use of probes on the production enterprise processing completed wafer products on the chip or semiconductor component function can be analyzed and tested to verify whether they can meet the Chinese product design specifications.

The test process requires the cooperation of the test bench and the tester, the test bench automatically transmits the wafers one by one to the test position, the pins of the chip are connected to the functional modules of the tester through the test bench, the tester applies the input signals to the chip, collects the output signals, and determines whether the functions and performances of the chip are in line with the requirements of the design specifications.

The test results are transmitted to the probe station through the communication interface, and the probe station marks the chip accordingly to form the wafer result mapping, and marks the invalid chip as much as possible to save the packaging cost.

02 Finished Test

Final test, also known as final test, is to test the functional and electrical parameters of the chip after packaging to ensure that the function and performance of each chip can meet the design requirements.wafer level testing The testing process for chip design verification is similar to the finished product testing process.

The testing process requires the cooperation of sorters and testers.

The sorter automatically transfers the chips under test one by one to the system test station, and the pins of the chips under test need to be networked with the tester's Function Management Module design through probes mounted on a test stand.

The tester receives input signals to the chip and collects output signals to determine whether the function and performance of the chip meet the design specifications. The test results are transmitted through the communication interface to the sorter, which marks, sorts, collects, or records the chip under test.

Test Probes Market Landscape

If a chip fault is not detected during chip testing, the cost of detecting the fault at the PCB level is ten times higher than at the chip level. So the higher the technology and the smaller the process, the higher the requirement for yield in the test process. Therefore, test probes have a very important position.

According to the different areas of application, they can be divided into semiconductor test probes, PCB test probes, ICT in-line test probes, shrapnel test probes, RF test probes, failure analysis wiring harness test probes, charging test probes and other types.

Problems faced by domestic probes

On the one hand, foreign test probe manufacturers are usually stronger technical strength, focusing on one or several areas of the product, have their own core customers. On the other hand, for Chinese probe manufacturers, there are bottlenecks in the areas of raw materials, processes, equipment and other areas upstream of the probe.

Domestic probe ushered in a new driving force

Domestic sealing test to the good, driven by the growing demand for probes

In the past two years, a number of seal testing manufacturers have raised a lot of money to expand the production line, a number of seals stored testing projects. With the development of the domestic testing industry, it will accelerate the localization process of upstream equipment and components such as probe stations.

As an important equipment used in the testing of semiconductor products, the quality of test probes has an important impact on the test results of semiconductor products, production efficiency and production cost control.

First Profit has been committed to the development of the probe business, adhere to the independent development of high-quality test probes, the use of advanced material structure, lean coating treatment, quality assembly process. To provide customers with the best quality probe products, such as high-frequency semiconductor needles, First Profit can be processed with the smallest needles: 0.06 mm, needles: 0.10 mm.