The steps for setting up the HF probe test environment and placing the needle are as follows

1. Prepare test equipment:

- High-frequency probe: choose a high-frequency probe suitable for the test requirements,wafer tester such as GSG single-ended probe, GSSG differential probe, to ensure that it is suitable for the characteristics of the object to be tested and the test requirements.

- Probe arm: install the high-frequency probe on the triaxial probe arm and use the ZXY adjustment function.

- Network analyzer: Prepare the network analyzer and ensure that it has sufficient bandwidth and impedance matching capability.

2. Prepare the test sample:

- High-frequency circuit boards (PCBs) or other devices are used as test samples to ensure that their surfaces are purified and cleaned to eliminate dirt or oxides that may affect test results.

3. Mounting the probe arm and positioning:

- Install the probe on the 3-axis probe arm and use the ZXY adjustment function to accurately position the probe tip to the pad or test point on the sample to be tested.

4. Setting test parameters:

- According to the test requirements, set the test parameters of the network analyzer to ensure that the selected parameters match the high-frequency signals under test.

5. Perform HF probe flatness test:

- Select high-frequency probes suitable for the test requirements, such as GSG single-ended probes and GSSG differential probes,wafer probe testing to ensure that they are suitable for the characteristics of the object to be tested and the test requirements.

- Using the three-axis adjustment function of the probe arm, adjust the probe above the pads of the object to be tested to make pre-contact. Ensure that the probe is at the appropriate distance from the test item by adjusting the position of the Z, X and Y axes.

- Use a microscope to magnify and focus the pads of the test object to be measured. Observe the probe in the microscope by fine-tuning the three axes of the probe arm so that it becomes clear and in focus. Ensure that the tip of the probe can be clearly seen.

- Carefully observe the behavior of the probe, paying special attention to the presence of "jumping". After the probe "jumps" during the adjustment process, you can back off a little, and then press down some more to make the probe more stable in contact with the object to be measured.

- After completing the observation and adjustment, disconnect the probe from the object to be measured. Observe whether clear probe needle marks appear on the object to be measured. If a GSSG HF probe is used, you will see four points of needle marks appear on the object to be tested, from top to bottom corresponding to the contact points of the ground pin, the signal pin, and the signal and ground pins.

6. Carry out the formal test operation:

- After completing the test of probe flatness, use the three-axis adjustment function of the probe arm to contact the probe to the PCB board to be tested pads.

- Ensure that the contact between the probe and the pad to be tested is stable, and the probe tip has good contact with the pad surface.

- In conjunction with the use of a network analyzer for specific specification testing. Network analyzers are used to measure and analyze signal transmission characteristics in circuits, such as impedance, S-parameters (scattering parameters), and so on.

- During the test process, use the network analyzer to set the appropriate test parameters, such as frequency range,vibration isolation table measurement mode, and so on. Then start the test, the network analyzer will send high-frequency signals to the pads to be tested, and then measure and record the corresponding electrical signal data.

- Through the analysis function of the network analyzer, evaluate the frequency response, amplitude response, phase response and other performance indicators of the pad to be tested to determine its compliance with the specifications.

- Ensure that operations are accurate and follow relevant safety procedures. Depending on the specific test requirements and equipment specifications, the test parameters can be further optimized to obtain accurate test results.